Nano Laser Particle Size Analyzer, DLS PSA-N802

PSA-N802 is based on the dynamic light scattering (DLS) principle, adopts the high-performance PMT (Hamamatsu) and high-speed digital correlator. It measures the changes in scattered light at a specific angle to obtain the diffusion coefficient, and then calculates the particle diameter and particle size distribution in accordance with the Stokes-Einstein equation. With fast calculation speed, high resolution, excellent accuracy, and good repeatability, this analyzer is widely used in corporate product laboratories, research facilities, and universities.

Features

Advanced Testing Principle

Adopting the dynamic light scattering principle and photon correlation spectroscopy (PCS) technology, it measures particle size based on the Brownian motion speed of particles. Particles of different sizes move at different speeds; when laser light irradiates these particles, the scattered light exhibits fluctuations at corresponding speeds. The photon correlation spectroscopy method analyzes the particle size by detecting the photon fluctuations in a specific direction.

High Resolution

Testing nano particle size via PCS technology requires the ability to distinguish nanosecond-level signal fluctuations. The CR256 digital correlator achieves a high resolution speed of 8ns.

High Sensitivity and SNR

The detector is composed of the Hamamatsu PMT, ensuring exceptional measurement accuracy.

High-Speed Data Collection and Calculation

Equipped with the CR256 digital correlator, the instrument can complete dynamic scattered light intensity collection and real-time calculation of autocorrelation functions. With a data processing speed of up to 162M, it effectively captures dynamic scattered light information from particles of varying sizes.

Highly Stable Optical Path System

The PCS detection system adopts optical fiber technology, featuring a compact structure, strong anti-interference capability, and high reliability.

High-Precision Constant Temperature Control System

Utilizing semiconductor temperature control technology, the system achieves precise temperature regulation within a range of ±0.1℃. This keeps the sample in a stable constant temperature state throughout the entire testing process, preventing measurement errors caused by changes in liquid viscosity and Brownian motion speed due to temperature fluctuations.

Software

Test Report

Specification